The today released Version 2.5 of Tessy , our automated test suite for embedded Software, adds support for new measurement methods of code coverage.
The coverage measurement has been enhanced to support Modified Condition / Decision Coverage (MC/DC) and Multiple Condition Coverage (MCC). Both new measurement methods can be combined with the existing C1 (branch / decision) coverage measurement.
For a much easier handling of test data for called functions, Tessy now supports a simple check of the transfer parameters as well as a simple definition of return values directly in the Test Data Editor. With this so-called "Advanced Stub" function, Tessy offers more flexibility during testing and it is no longer necessary to manually program all stub functions. Stub functions, normal or advanced, may now be specified for each test object individually or globally for the whole module.
The configuration of TESSY allows now the generation of individual configuration files for each project. The configuration manager allows the administration of these configuration files for every project member.
TTo stimulate and verify external signals, a new interface has been implemented, which is open for third parties to connect. The first to make use of this interface is the new Tanto2 multiTEST hardware from our sales partner Hitex Systementwicklung GmbH.
Additional microcontrollers are now supported: From Freescale the DSP568E and PPC5xxx and from Renesas the CCR32, NC30, and SH.
